In-situ microscale through-silicon via strain measurements by synchrotron x-ray microdiffraction exploring the physics behind data interpretation
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چکیده
منابع مشابه
Probing Stress States in Silicon Nanowires During Electrochemical Lithiation Using In Situ Synchrotron X-Ray Microdiffraction
Citation: Ali I, Tippabhotla SK, Radchenko I, Al-Obeidi A, Stan CV, Tamura N and Budiman AS (2018) Probing Stress States in Silicon Nanowires During Electrochemical Lithiation Using In Situ Synchrotron X-Ray Microdiffraction. Front. Energy Res. 6:19. doi: 10.3389/fenrg.2018.00019 Probing stress states in silicon nanowires During electrochemical lithiation Using In Situ synchrotron X-ray Microdi...
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